Date: 30-Mar-2009
From: Maojin Jiang <jianmao iit.edu>
Subject: CIKM'09 Workshop on Topic-Sentiment Analysis
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Full Title: CIKM'09 Workshop on Topic-Sentiment Analysis
Short Title: TSA'09
Date: 06-Nov-2009 - 06-Nov-2009
Location: Hong Kong, Hong Kong
Contact Person: Maojin Jiang
Meeting Email: jianmaoiit.edu
Web Site: http://sites.google.com/site/tsa2009workshop
Linguistic Field(s): Cognitive Science; Computational Linguistics; Semantics;
Text/Corpus Linguistics
Call Deadline: 20-Jul-2009
Meeting Description:
This workshop seeks to bring together researchers in both computer science and
social sciences who are interested in developing and using topic-sentiment
analysis methods to measure mass opinion, and to foster communications between
the research community and industry practitioners as well.
Call for Papers
1st International CIKM Workshop on Topic-Sentiment Analysis for Mass Opinion
Measurement
November 6, 2009
Hong Kong
http://sites.google.com/site/tsa2009workshop
The increasing amount of user-generated content on the Internet and social media
and the digitization of large number of government and institutional documents
provide new opinion-rich data sources for researchers to examine individual and
group perceptions on products, organizations, and social issues at a large
scale, and thus contribute to the research and practice in the areas of
political science, social policy, communications, and business intelligence.
On the other hand, researchers are tackling the problem of processing large
amount of opinion-rich data using various approaches. The increasing number of
relevant publications in top data mining, information retrieval and natural
language processing conferences (KDD, SIGIR, ACL, WWW, etc.) has witnessed the
growing interest in automatic opinion analysis. Both TREC and TAC (Text Analysis
Conference) have set up individual tracks for opinion retrieval and analysis tasks.
In recent years topic detection and tracking techniques have been well developed
to identify the issues discussed in a large text collection. Sentiment analysis
is catching up to detect the polarity of opinions expressed in texts. However,
many times real-world applications have to take into consideration of both
topics and sentiments for precise opinion measurement. Topic and sentiment
alignment is crucial for opinion retrieval, extraction, categorization, and
aggregation on various issues. Topics and sentiments could also have
sophisticated interactions. For example, the choice of topics and the attention
distribution among topics might bear hidden opinions as well.
How do we build synergistic topic and sentiment models for text documents? How
do we tackle the domain-dependency problem of sentiment analysis? How do we
identify users' needs and integrate them into the design of opinion analysis
systems? What are the successful applications of topic-sentiment analysis for
mass opinion measurement? What lessons have the pioneers learned? How do we
evaluate the automatic mass opinion measuring tools with regard to the
reliability and validity? This workshop solicits submissions to address these
problems and more.
We hope this workshop can advance research in topic-sentiment analysis, make
connections between research community and industry practitioners and encourage
development of high performance tools and systems that can work at the web scale
for real world applications.
Topics of Interest
Suggested topics include, but are not limited to:
- Opinion retrieval, extraction, categorization, and aggregation
- Topic and sentiment alignment in opinion analysis
- Applications of topic-sentiment analysis, e.g. corporate reputation
measurement, political orientation categorization, customer preference study,
public opinion study
- Issues in using topic-sentiment analysis as a new research method for mass
opinion estimation, such as reliability, validity, sample bias, etc.
- Sentiment identification and filtering at various text granularity
- Domain-dependency of sentiment analyzers
- Evaluation methodologies
- Performance issues, scalability and efficiency
- Web-based system demonstration
- Novel algorithms, tools and systems
- Construction of benchmark data sets
Important Dates
- Individual workshop papers due: July 20, 2009
- Notification of Acceptance: August 10, 2009
- Camera ready: August 15, 2009 (hard deadline for publication in proceedings)
- Early registration deadline: August 15, 2009
- Workshop: November 6, 2009
Submission
- All workshop papers will be up to 8 pages, double column in the ACM format. No
extra pages can be purchased for all workshop papers.
- Papers must be submitted in PDF files. Please ensure that your paper is
formatted by using the ACM templates, which is available at
http://www.acm.org/sigs/publications/proceedings-templates
- At least one author of each accepted paper must register for the workshop.
Registration must be done at the time when the author sends the camera-ready
copy of the accepted paper to the workshop chair.
- Workshop proceedings will be printed along with the CIKM proceedings by ACM.
Thus, the timeline to print proceedings must strictly follow with the CIKM
proceedings schedule.
- Submission website will be up soon, please check the workshop website
regularly for updates.
Organizers and Contacts
Bei Yu, bei-yunorthwestern.edu, Northwestern University, USA
Maojin Jiang, jianmaoiit.edu, Illinois Institute of Technology, USA
http://sites.google.com/site/tsa2009workshop
Program Committee
James Allan, University of Massachusetts Amherst (USA)
Shlomo Argamon, Illinois Institute of Technology (USA)
Kenneth Bloom, Illinois Institute of Technology (USA)
Claire Cardie, Cornell University (USA)
Michael Gamon, Microsoft Research (USA)
Natalie Glance, Google (USA)
Xiao Hu, Riverglass (USA)
Matthew Hurst, Microsoft Live Lab (USA)
Panagiotis G. Ipeirotis, New York University (USA)
Maojin Jiang, Illinois Institute of Technology (USA)
Stefan Kaufmann, Northwestern University (USA)
Thomas Y. Lee, University of Pennsylvania (USA)
Qiaozhu Mei, University of Illinois at Urbana-Champaign (USA)
Ana-Maria Popescu, Yahoo! Labs (USA)
Richard Sproat, University of Illinois at Urbana-Champaign (USA)
Veselin Stoyanov, Cornell University (USA)
Stuart W. Shulman, University of Massachusetts Amherst (USA)
John D. Wilkerson, University of Washington (USA)
Waigen Yee, Illinois Institute of Technology (USA)
Bei Yu, Northwestern University (USA)
Chengxiang Zhai, University of Illinois at Urbana-Champaign (USA)
Xiaojin Zhu, University of Wisconsin-Madison (USA)
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